SURFACE systems + technology GmbH & Co. KG
SURFACE nanometrology
SURFACE nanometrology News Ticker:
New: Market launch of our sm@rt 500 nanoindenter system. Small in design - big in performance.
SURFACE nanometrology News Ticker:
New: Micro controller controlled Humidity Controller for material science investigations
New: 200 mm automated vacuum chuck for the G200 nanoindenter allows measurement of the entire wafer surface under constant measurement conditions (frame stiffness)
SURFACE PLD Technology News Ticker:
New: Battery Workstation delivered to Cambridge University , GB. It combines three different physical coating processes with a glove box: PLD, sputtering, thermal evaporation and all on a single standard workstation system frame
New: Insitu- Beamline PLD System installed at Karlsruhe KIT allows unique thin film investigations in the synchrotron beam

sm@rt 500 Nanoindenter - The smart way of material research

Key Features

Sample tray
Solid and compact layout
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  • Powerful transducer ranging from μN to ~N.
  • Fully integrated high resolution video microscope.
  • Three axis motorized positioning system for various sample stages.
  • Solid frame for robustness and reliable testing.
  • Real time data processing by dual core microcontroller (DSP).
  • The instrument is designed with priority to highest accuracy and reliability.








Application

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The whole setup offers a small footprint
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  • Fully automated tests to determine hardness and modulus
  • Standardized tests to comply with ISO 14577
  • Optical microscopy
  • Customized test procedures
  • Material research
  • Quality control








Video microscope, 5MP for selecting position and inspection

Sample tray
Front view, microscope objective close to indenter tip
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Sample tray
Compact microscope on backside of indenter frame
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  • Combines large field of view (0.8 * 1.1 mm) with high resolution / magnification
  • Magnification selectable in software from 150x to 600x (100% scale), extended to 2400x (400%)
  • digital resolution: 0.4 μm / pixel
  • optical resolution: approx. 2 μm












Smart software package

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For advanced users: Powerful post processing of the measured data
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For the operator: Clearly structured control user interface
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  • Control software: intuitive and clean user interface
  • Analysis software: fast selection of measurement tasks and test locations on the sample
  • Automatic data analysis
  • Editable data analysis for advanced users
  • Export to csv files
  • Sharing data and export to cloud based open material database
  • Developed from the long-standing practice of the nanoLab team
  • Optimized for fast and efficient operation





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Thursday, 2021-07-29  07:30