SURFACE systems + technology GmbH & Co. KG
SURFACE nanometrology
SURFACE nanometrology News Ticker:
New: Market launch of our sm@rt 500 nanoindenter system. Small in design - big in performance.
SURFACE nanometrology News Ticker:
New: Micro controller controlled Humidity Controller for material science investigations
New: 200 mm automated vacuum chuck for the G200 nanoindenter allows measurement of the entire wafer surface under constant measurement conditions (frame stiffness)
SURFACE PLD Technology News Ticker:
New: Battery Workstation delivered to Cambridge University , GB. It combines three different physical coating processes with a glove box: PLD, sputtering, thermal evaporation and all on a single standard workstation system frame
New: Insitu- Beamline PLD System installed at Karlsruhe KIT allows unique thin film investigations in the synchrotron beam

Scanning Probe Techniques

AFM
Atomic Force Microscopy

Our laboratory is equipped with a set of SPM devices to determine the topography down to subnanometer resolution. Using our NT-MDT NTEGRA and Park Systems (PSIA) XE-100 microscopes employing functionalized tips, electronic (STM), magnetic (MFM), topological (AFM), and thermal properties are obtained as a function of the surface coordinates. Measurements are performed with latest technology and with high accuracy, minimizing mechanical effects on the tested specimens.

The following measurement services are available:

  • Topography
  • Roughness analysis
  • Mapping of thermal, magnetic, and electronic properties
  • Thermal transitions in polymers
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Saturday, 2020-09-26  11:14