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NANO Vision
  MTS innovation delivers a truly quantitative imaging system

INTRODUCTION TO NANOMECHANICAL MICROSCOPY
Nanomechanical microscopy is the technique of utilizing the indenter tip within an electromagnetic actuation-based indentation head assembly to probe the surface of a sample, generating a 3-dimensional map of the surface. The NANO VisionTM nanomechanical microscopy extension, available only from MTS Nano Instruments, delivers this technique by pairing a linear electromagnetic actuation-based indentation head assembly with a closed-loop nanopositioning stage.

HOW IT WORKS
The NANO Vision instrument extension functions in a manner similar to an atomic force microscope operating in contact mode. Specialized test methods enable either the XP or DCM indentation head assemblies to probe the surface of a sample with the diamond tip that is used for indenting. As the sample is traversed under the indenter tip, the interactions of the tip with the surface cause the indenter column to deflect or result in a measurable change in some measured interaction between the tip and the sample. The change in these interactions as the sample is scanned under the tip allow for a detailed 3- dimensional map of a surface to be constructed.

Analysis of the resulting 3-dimensional images can provide important information about the material’s response.

For example, these images may be used to further investigate the effects of phenomena such as pile-up and sink-in on the calculation of contact area. Another extremely useful application of nanomechanical microscopy is in-situ imaging in support of indentation placement. Precise placement of indentations on a complex sample, such as a component on a MEMS device with a very low stiffness, is possible through the use of the NANO Vision instrument option. Dual modes of operation, batch mode and interactive mode, come standard with the NANO Vision option and enable each these applications and more.

The components that comprise the NANO Vision extension include: TestWorks®3D software, with a suite of specialized methods that enable scanning with both the XP and DCM indentation head assemblies in batch mode or in an interactive mode. Also included with the NANO Vision option is the NANO ScanTM closed-loop nanopositioning stage.

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