SURFACE systems + technology GmbH & Co. KG
SURFACE nanometrology
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Scanning Probe Techniques

AFM
Atomic Force Microscopy

Our laboratory is equipped with a set of SPM devices to determine the topography down to subnanometer resolution. Using our NT-MDT NTEGRA and Park Systems (PSIA) XE-100 microscopes employing functionalized tips, electronic (STM), magnetic (MFM), topological (AFM), and thermal properties are obtained as a function of the surface coordinates. Measurements are performed with latest technology and with high accuracy, minimizing mechanical effects on the tested specimens.

The following measurement services are available:

  • Topography
  • Roughness analysis
  • Mapping of thermal, magnetic, and electronic properties
  • Thermal transitions in polymers
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Thursday, 2017-09-21  06:49