SURFACE systems + technology GmbH & Co. KG
SURFACE nanometrology
+++ SURFACE Newsticker +++
April 2012: burning globe The new SURFACE web shop is online – conveniently request quotations and place credit card orders online burning globe
December 2011: SURFACE has been awarded the contract to build a PLD chamber for in-situ diffraction studies at the ANKA synchrotron light source, KIT 
December 2011: Launch of our redesigned SURFACE homepage
November 2011: The SURFACE LED Flange Lights have been featured as product of the month in the Physik Journal
September 2011: The new R-DEC PICO-RHEED system for RHEED monitoring of organic thin film growth

Scanning Probe Techniques

AFM
Atomic Force Microscopy

Our laboratory is equipped with a set of SPM devices to determine the topography down to subnanometer resolution. Using our NT-MDT NTEGRA and Park Systems (PSIA) XE-100 microscopes employing functionalized tips, electronic (STM), magnetic (MFM), topological (AFM), and thermal properties are obtained as a function of the surface coordinates. Measurements are performed with latest technology and with high accuracy, minimizing mechanical effects on the tested specimens.

The following measurement services are available:

  • Topography
  • Roughness analysis
  • Mapping of thermal, magnetic, and electronic properties
  • Thermal transitions in polymers
About SURFACE  How to find us  Contact us  Impressum  ©1988-2012 SURFACE systems + technology GmbH & Co. KG
Friday, 2012-05-18  21:35