SURFACE systems + technology GmbH & Co. KG
SURFACE nanometrology
+++ SURFACE Newsticker +++
April 2012: burning globe The new SURFACE web shop is online – conveniently request quotations and place credit card orders online burning globe
December 2011: SURFACE has been awarded the contract to build a PLD chamber for in-situ diffraction studies at the ANKA synchrotron light source, KIT 
December 2011: Launch of our redesigned SURFACE homepage
November 2011: The SURFACE LED Flange Lights have been featured as product of the month in the Physik Journal
September 2011: The new R-DEC PICO-RHEED system for RHEED monitoring of organic thin film growth

SURFACE Nanolab

Dr. Dennis Bedorf
Dr. Dennis Bedorf,
Head of Nanolab

Understanding and characterizing the behavior of surfaces and interfaces with high lateral resolution has become an important key to exploring new materials and technologies. The mechanical behavior of micro structures, thin films and coatings may be completely different from that in bulk materials.

The SURFACE Nanolab offers a variety of quantitative characterization methods for metrology, electronic, thermal and mechanical surface properties. Based on extensive lab experience, we can provide a wide range of services to our customers, such as:

  • Contract measurements and simulation of indentation experiments
  • Consulting for advanced testing applications
  • Development of custom tailored testing setups and methods
  • Instrument demonstrations, test measurements
  • Participation in research projects
  • Technical and application support for equipment purchased from SURFACE
  • User training and workshops
Martin Knieps
Dipl.-Min. Martin Knieps,
Lab Scientist

In over 13 years, our lab has tested a variety of materials such as metals, ceramics, semiconductors, polymers and biomaterials. Together with our customers from science and industry we have investigated various topics such as:

  • Mechanical properties of aerospace alloys
  • Dynamic and temperature dependent properties of polymer surfaces
  • Characterization of MEMS
  • Multilayers and low-κ materials in semiconductor industry
  • Scratch and wear resistance of resins and paint
  • Fiber reinforced materials
  • High precision indentation on grains and microelectronics
  • Thin film characterization

Please allow us to demonstrate our capabilities and test us testing your samples!

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Friday, 2012-05-18  21:45